Tetrakis(dimethylamido)hafnium
99.9999% metals basis
Reagent
Code: #242434
CAS Number
19782-68-4
blur_circular Chemical Specifications
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Molecular Information
Weight
354.79 g/mol
Formula
C₈H₂₄HfN₄
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Registry Numbers
MDL Number
MFCD01862473
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Physical Properties
Melting Point
26-29 °C (lit.)
Boiling Point
85 °C at 0.1 mmHg (lit.)
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Storage & Handling
Density
1.098 g/cm3 at 25 °C (lit.)
Storage
Room temperature, dry
description Product Description
Widely used in semiconductor manufacturing, this chemical serves as a precursor for depositing hafnium-containing thin films via atomic layer deposition (ALD) and chemical vapor deposition (CVD). It enables the formation of high-k dielectric layers, which are critical in advanced microelectronic devices such as transistors and capacitors. Its high reactivity and volatility allow for precise, low-temperature film growth, making it suitable for fabricating next-generation integrated circuits. Additionally, it is explored in the development of metal-insulator-metal structures and gate oxides where uniformity and interface quality are essential.
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