Tetrakis(dimethylamido)hafnium
99.99%
Reagent
Code: #239032
CAS Number
19782-68-4
blur_circular Chemical Specifications
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Molecular Information
Weight
354.79 g/mol
Formula
C₈H₂₄HfN₄
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Registry Numbers
MDL Number
MFCD01862473
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Physical Properties
Melting Point
26-29 °C (lit.)
Boiling Point
85 °C at 0.1 mmHg (lit.)
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Storage & Handling
Density
1.098 g/cm3 at 25 °C (lit.)
Storage
Room temperature, dry
description Product Description
Widely used as a precursor in atomic layer deposition (ALD) and chemical vapor deposition (CVD) processes for fabricating high-k dielectric films. These films are critical in semiconductor manufacturing, especially for gate oxides in advanced transistors. Offers excellent thermal stability and volatility, enabling precise, uniform thin film growth at relatively low temperatures. Preferred in microelectronics for enabling device scaling due to its ability to form high-quality hafnium-based dielectrics with low impurity levels. Also explored in the development of nanoscale electronic devices and next-generation memory technologies.
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