Hafnium(IV) ethoxide

99.9% (metals basis)

Reagent Code: #194522
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CAS Number 13428-80-3

blur_circular Chemical Specifications

scatter_plot Molecular Information
Weight 358.73 g/mol
Formula Hf(OC₂H₅)₄
badge Registry Numbers
MDL Number MFCD00070459
thermostat Physical Properties
Melting Point 178-180ºC
Boiling Point 180-200ºC 13mm
inventory_2 Storage & Handling
Storage Room temperature, seal, dry

description Product Description

Used as a precursor in the production of hafnium dioxide (HfO₂) thin films through sol-gel processes and chemical vapor deposition (CVD). These films are critical in semiconductor manufacturing, particularly as high-k dielectric materials in advanced transistors and integrated circuits. Offers good thermal stability and high dielectric constant, enabling improved performance and reduced leakage current in microelectronic devices. Also employed in the synthesis of hafnia-based coatings and nanomaterials for optical and protective applications. Its reactivity with moisture allows for controlled hydrolysis to form dense, uniform oxide layers suitable for electronic and optical coatings.

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Size Availability Unit Price Quantity
inventory 1g
10-20 days ฿11,190.00

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