Hafnium(IV) ethoxide
99.9% (metals basis)
Reagent
Code: #194522
CAS Number
13428-80-3
blur_circular Chemical Specifications
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Molecular Information
Weight
358.73 g/mol
Formula
Hf(OC₂H₅)₄
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Registry Numbers
MDL Number
MFCD00070459
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Physical Properties
Melting Point
178-180ºC
Boiling Point
180-200ºC 13mm
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Storage & Handling
Storage
Room temperature, seal, dry
description Product Description
Used as a precursor in the production of hafnium dioxide (HfO₂) thin films through sol-gel processes and chemical vapor deposition (CVD). These films are critical in semiconductor manufacturing, particularly as high-k dielectric materials in advanced transistors and integrated circuits. Offers good thermal stability and high dielectric constant, enabling improved performance and reduced leakage current in microelectronic devices. Also employed in the synthesis of hafnia-based coatings and nanomaterials for optical and protective applications. Its reactivity with moisture allows for controlled hydrolysis to form dense, uniform oxide layers suitable for electronic and optical coatings.
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