5-(Trifluoromethyl)dibenzothiophenium trifluoromethanesulfonate

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Reagent Code: #240561
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CAS Number 129946-88-9

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blur_circular Chemical Specifications

scatter_plot Molecular Information
Weight 402.33 g/mol
Formula C₁₄H₈F₆O₃S₂
badge Registry Numbers
MDL Number MFCD00236132
thermostat Physical Properties
Melting Point 150°C (Lit.)
inventory_2 Storage & Handling
Storage Room temperature, seal, dry

description Product Description

Used as a photoacid generator (PAG) in advanced photolithography processes, particularly in semiconductor manufacturing. Upon exposure to deep ultraviolet (DUV) or extreme ultraviolet (EUV) light, it releases strong acid, enabling precise patterning of microelectronic circuits. Its high thermal stability and efficient acid generation make it suitable for resist formulations requiring high resolution and low outgassing. Also applied in cationic polymerization reactions where controlled initiation is needed under light exposure.

shopping_cart Available Sizes & Pricing

Size Availability Unit Price Quantity
inventory 1g
10-20 days ฿3,080.00
inventory 5g
10-20 days ฿11,150.00
inventory 25g
10-20 days ฿49,520.00

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5-(Trifluoromethyl)dibenzothiophenium trifluoromethanesulfonate
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Used as a photoacid generator (PAG) in advanced photolithography processes, particularly in semiconductor manufacturing. Upon exposure to deep ultraviolet (DUV) or extreme ultraviolet (EUV) light, it releases strong acid, enabling precise patterning of microelectronic circuits. Its high thermal stability and efficient acid generation make it suitable for resist formulations requiring high resolution and low outgassing. Also applied in cationic polymerization reactions where controlled initiation is neede

Used as a photoacid generator (PAG) in advanced photolithography processes, particularly in semiconductor manufacturing. Upon exposure to deep ultraviolet (DUV) or extreme ultraviolet (EUV) light, it releases strong acid, enabling precise patterning of microelectronic circuits. Its high thermal stability and efficient acid generation make it suitable for resist formulations requiring high resolution and low outgassing. Also applied in cationic polymerization reactions where controlled initiation is needed under light exposure.

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